G.tecz offers you SEM  analysis of your materials, specimens or objects.

The electron microscope is the ultimate all-in-one imaging and X-ray analysis system.


  • One system, all answers
  • Magnification range 20 – 100,000x
  • Element detection range: C – Am
  • Long-life high-brightness source (CeB6)
  • Multiple acceleration voltages: 5 kV and 10 kV for high-resolution images, and 15 kV for great analysis results
  • Electron beam current selection for tuning imaging settings or high throughput analysis


- Prize per material

- Picture-Report included

220,00 €

Laser Diffraction Particle Size Analysis

G.tecz offers you the analysation of fines. The Laser Diffraction Particle Size Analyzers measure particle size using the classic Mie theory of light scattering and PIDS technology, offering high resolution, reproducibility and unsurpassed accuracy. These analyzers provide size distribution in volume, number and surface area in one measurement, with an overall sizing range from 17 nm to 2000 µm.


- Prize per material

- Diagram-Report included


110,00 €

... more items coming soon ...